Articles by Erkki Ikonen

Leaf reflectance and transmittance spectra are essential information in many applications such as developing remote sensing methods, computing shortwave energy balance (albedo) of forest canopies, and monitoring health or stress of trees. Measurement of coniferous needle spectra has usually been carried out with single integrating spheres, which has involved a lot of tedious manual work. A small double integrating sphere would make the measurements considerably faster, because of its ease of operation and small sample sizes required. Here we applied a compact double integrating sphere setup, used previously for measurement of broad leaves, for measurement of coniferous needles. Test measurements with the double integrating sphere showed relative underestimation of needle albedo by 5–39% compared to a well-established single integrating sphere setup. A small part of the bias can be explained by the bias of the single sphere. Yet the observed bias is quite significant if absolute accuracy of measurements is required. For relative measurements, e.g. for monitoring development of needle spectra over time, the double sphere system provides notable improvement. Furthermore, it might be possible to reduce the bias by building an optimized measurement setup that minimizes absorption losses in the sample port. Our study indicates that double spheres, after some technical improvement, may provide a new and fast way to collect extensive spectral libraries of tree species.

• Hovi, Aalto University, School of Engineering, Department of Built Environment, P.O.Box 14100, FI-00760 Aalto, Finland https://orcid.org/0000-0002-4384-5279 E-mail: aarne.hovi@aalto.fi
• Mõttus, VTT Technical Research Centre Finland, P.O. Box 1000, FI-02044 VTT, Finland https://orcid.org/0000-0002-2745-1966 E-mail: matti.mottus@gmail.com
• Juola, Aalto University, School of Engineering, Department of Built Environment, P.O.Box 14100, FI-00760 Aalto, Finland E-mail: jussi.juola@aalto.fi
• Manoocheri, Aalto University, School of Electrical Engineering, Metrology Research Institute, Maarintie 8, FI-02150 Espoo, Finland https://orcid.org/0000-0003-3935-3930 E-mail: farshid.manoocheri@aalto.fi
• Ikonen, VTT Technical Research Centre Finland, P.O. Box 1000, FI-02044 VTT, Finland; Aalto University, School of Electrical Engineering, Metrology Research Institute, Maarintie 8, FI-02150 Espoo, Finland https://orcid.org/0000-0001-6444-5330 E-mail: erkki.ikonen@aalto.fi
• Rautiainen, Aalto University, School of Engineering, Department of Built Environment, P.O.Box 14100, FI-00760 Aalto, Finland; Aalto University, School of Electrical Engineering, Department of Electronics and Nanoengineering, P.O. Box 15500, FI-00760 Aalto, Finland https://orcid.org/0000-0002-6568-3258 E-mail: miina.a.rautiainen@aalto.fi